Mitigation of mechanical degradation in silicon thin-film anodes via delithiation cut-off voltage control (Materials Advances)
Y. Eto, K. Nozawa, T. Suemasu and K. Toko,
“Mitigation of mechanical degradation in silicon thin-film anodes via delithiation cut-off voltage control”,
Materials Advances 7 (2026) 192-197. (DOI:10.1039/d5ma01185)
投稿日:2025年12月17日