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Differences between Polar-Face and Non-Polar Face 4H-SiC /SiO2 Interfaces Revealed by Magnetic Resonance Spectroscopy (Defect and Diffusion Forum)

R. Kondo, H. Zeng, M. Sometani, H. Hirai, H. Watanabe, and T. Umeda,
“Differences between Polar-Face and Non-Polar Face 4H-SiC /SiO₂ Interfaces Revealed by Magnetic Resonance Spectroscopy”,
Defect and Diffusion Forum 434 (2024) 99-103. (DOI:10.4028/p-YKtpW3)