Defects in BaSi2 by EPR, PL and DFT (Japanese Journal of Applied Physics)

T. Sato, Y. Cao, M. Imai, J.-M. Mouesca, T. Suemasu and S. Gambarelli,
“Defects in BaSi2 by EPR, PL and DFT”,
Japanese Journal of Applied Physics 64 (2025) 120802. (DOI:10.35848/1347-4065/ae23d8)