Comparative analysis of passivation effects of AlOx, amorphous Si, and amorphous SiC in BaSi2 light-absorbing layers (Thin Solid Films)

K. Hayashi, Y. Ishiguro, T. Sato, Y. Koda, M. Mesuda, K. Toko and T. Suemasu,
“Comparative analysis of passivation effects of AlO_x, amorphous Si, and amorphous SiC in BaSi₂ light-absorbing layers”,
Thin Solid Films 847 (2026) 140980. (DOI:10.1016/j.tsf.2026.140980)